Power-Constrained Testing of VLSI Circuits A Guide to the IEEE 1149.4 Test Standard

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Power-Constrained Testing of VLSI Circuits A Guide to the IEEE 1149.4 Test Standard
99,24 €
inkl. MwSt.
Gratis Versand

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design

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